Skip to main navigation Skip to search Skip to main content

Thermoreflectance imaging of laser diodes and VCSELs along and perpendicular to the emission direction

  • M. Bardoux*
  • , A. Bousseksou
  • , G. Tessier
  • , S. Bouchoule
  • , D. Fournier
  • , A. Salhi
  • , Y. Rouillard
  • , F. Genty
  • *Corresponding author for this work
  • LPEM
  • LPN
  • CEM2

Research output: Contribution to journalArticlepeer-review

Abstract

Thermal characterization of semiconductor lasers is an important issue for optoelectronics. This paper presents our thermoreflectance measurements on two different types of laser diodes: classical ridge laser diodes and vertical cavity surface emitting lasers (VCSELs). We first studied the external temperature increase in ridge diodes in order to determine inhomogeneity. Then, we tried to determine the inner temperature of the VCSELs.

Original languageEnglish
Pages (from-to)473-476
Number of pages4
JournalOptics and Lasers in Engineering
Volume47
Issue number3-4
DOIs
Publication statusPublished - Mar 2009
Externally publishedYes

Keywords

  • Laser diodes
  • Thermal imaging
  • Thermoreflectance
  • VCSEL

Fingerprint

Dive into the research topics of 'Thermoreflectance imaging of laser diodes and VCSELs along and perpendicular to the emission direction'. Together they form a unique fingerprint.

Cite this