Abstract
Moisture-induced buckle delamination of thin inorganic layers on a polymer substrate was studied. Moisture has been found to have a significant effect on the failure mode. Experimentally, an increase in the buckle width, height and the total buckle delamination length with time and humidity was observed. Moreover, a transition from straight to telephone-cord buckle pattern was taken place in a humid environment. Applying only a uniaxial compressive strain on the thin layers did not result in the transition from straight to telephone-cord. For a compliant substrate the transition from straight to telephone-cord buckle occurred at significantly higher ratio of residual strain over critical buckling strain than for a rigid substrate. A simple model for buckling was applied. Using the energy release rate, the interfacial toughness was investigated as a function of relative humidity.
| Original language | English |
|---|---|
| Pages (from-to) | 1063-1073 |
| Number of pages | 11 |
| Journal | Thin Solid Films |
| Volume | 516 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 30 Jan 2008 |
| Externally published | Yes |
Keywords
- Adhesion
- Delamination
- Moisture absorption
- Thin layers