TEM characterization of near sub-grain boundary dislocations in directionally solidified multicrystalline silicon
- Maulid Kivambe*
- , Gaute Stokkan
- , Torunn Ervik
- , Birgit Ryningen
- , Otto Lohne
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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