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Abstract
With the increasing complexity of system-on-chip designs, the probability of having soft-errors is increasing sharply. Since, adder is one of the essential elements present in almost every digital system, therefore, by making adder fault tolerant will create a potential impact on wide variety of digital applications. In this paper, a review has been presented to demonstrate the previously proposed solutions for fault tolerant adder design. In addition to the self-checking approaches, this paper also presented self-repairing techniques. A comparative analysis in terms of complexity, fault coverage and area-overhead has also been presented to conclude the performance of each covered approach.
| Original language | English |
|---|---|
| Article number | 012002 |
| Journal | Journal of Physics: Conference Series |
| Volume | 2841 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 19 May 2024 |
| Event | 2024 7th International Conference on Circuits, Systems and Simulation, ICCSS 2024 - Virtual, Online, Malaysia Duration: 17 May 2024 → 19 May 2024 |
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Dive into the research topics of 'Reliable Adder Design: A Review'. Together they form a unique fingerprint.Projects
- 1 Finished
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EX-QNRF-NPRPS-13: Artificial Intelligence Assisted and Computationally Efficient Smart Vision Sensor
Bermak, A. (Lead Principal Investigator), Bouzerdoum, A. (Principal Investigator), Abubakar, A. (Graduate Student) & Ghulam Ghori, M. A. A. (Post Doctoral Fellow)
19/04/21 → 19/10/24
Project: Applied Research