TY - GEN
T1 - Redundancy analysis for tin oxide gas sensor array
AU - Shi, Minghua
AU - Guo, Bin
AU - Bermak, Amine
PY - 2006
Y1 - 2006
N2 - Using gas sensor array is widely accepted to overcome the non-selectivity of a single sensor. For tin oxide gas sensors, the size of array can't be very large due to the limited number of doping materials. In this paper, our experimental results shows that duplication of the sensors doped by the same metal is an efficient way to improve the selectivity of the array due to the fabrication mismatch of the sensor chip. We also compare two methods of reducing the dimension of gas patterns: removing the sensors providing redundant information in the array and using principle component analysis (PCA). The experimental results shows that when the number of components is too large PCA can be a useful tool to reduce the data dimension.
AB - Using gas sensor array is widely accepted to overcome the non-selectivity of a single sensor. For tin oxide gas sensors, the size of array can't be very large due to the limited number of doping materials. In this paper, our experimental results shows that duplication of the sensors doped by the same metal is an efficient way to improve the selectivity of the array due to the fabrication mismatch of the sensor chip. We also compare two methods of reducing the dimension of gas patterns: removing the sensors providing redundant information in the array and using principle component analysis (PCA). The experimental results shows that when the number of components is too large PCA can be a useful tool to reduce the data dimension.
UR - https://www.scopus.com/pages/publications/33847154566
U2 - 10.1109/DELTA.2006.75
DO - 10.1109/DELTA.2006.75
M3 - Conference contribution
AN - SCOPUS:33847154566
SN - 0769525008
SN - 9780769525006
T3 - Proceedings - Third IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2006
SP - 448
EP - 451
BT - Proceedings - Third IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2006
T2 - Third IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2006
Y2 - 17 January 2006 through 19 January 2006
ER -