Process monitoring and in line composition assessment of high throughput thin film processes by resonant Raman spectroscopy
- Victor Izquiero-Roca
- , Edgardo Saucedo
- , Alejandro Perez-Rodriguez
- , Juan Morante
- , Veronica Bermudez*
*Corresponding author for this work
- University of Barcelona
- Catalonia Institute for Energy Research
- NEXCIS
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review