TY - GEN
T1 - Process monitoring and in line composition assessment of high throughput thin film processes by resonant Raman spectroscopy
AU - Izquiero-Roca, Victor
AU - Saucedo, Edgardo
AU - Perez-Rodriguez, Alejandro
AU - Morante, Juan
AU - Bermudez, Veronica
PY - 2011
Y1 - 2011
N2 - Raman scattering is an optical non destructive technique well suited for quality control and process monitoring in advanced chalcogenide PV thin film technologies. Combination with suitable excitation and light collection optics allows for the analysis of phase, structure or composition inhomogeneities at both macroscopic and microscopic scales. Applicability of these techniques for the non destructive assessment of these complex absorbers at early process stages during the fabrication of the cells and modules will be discussed and evaluated.
AB - Raman scattering is an optical non destructive technique well suited for quality control and process monitoring in advanced chalcogenide PV thin film technologies. Combination with suitable excitation and light collection optics allows for the analysis of phase, structure or composition inhomogeneities at both macroscopic and microscopic scales. Applicability of these techniques for the non destructive assessment of these complex absorbers at early process stages during the fabrication of the cells and modules will be discussed and evaluated.
UR - https://www.scopus.com/pages/publications/84861048485
U2 - 10.1109/PVSC.2011.6186700
DO - 10.1109/PVSC.2011.6186700
M3 - Conference contribution
AN - SCOPUS:84861048485
SN - 9781424499656
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 3492
EP - 3494
BT - Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011
T2 - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011
Y2 - 19 June 2011 through 24 June 2011
ER -