Physical properties of Bi doped CdTe thin films grown by the CSVT method

  • O. Vigil-Galán*
  • , J. Sastré-Hernández
  • , F. Cruz-Gandarilla
  • , J. Aguilar-Hernández
  • , E. Marín
  • , G. Contreras-Puente
  • , E. Saucedo
  • , C. M. Ruiz
  • , V. Bermúdez
  • , M. Tufiño-Velázquez
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

A study of the physical properties of CdTe thin films doped with Bi is presented. CdTe:Bi thin films were deposited by the close space vapor transport (CSVT) technique using powdered CdTe:Bi crystals grown by the vertical Bridgman method. CdTe:Bi crystals were obtained with nominal Bi doping concentrations varying in the 1×1017-8×1018 cm-3 range. The physical properties of CdTe:Bi thin films were studied performing photoluminescence, X-ray, SEM, photoacoustic spectroscopy and resistivity measurements. We observed a decrease of the resistivity values of CdTe:Bi films with the Bi content as low as 6×105 Ω-cm for Bi concentrations of 8×1018 cm-3. These are meaningful results for CdTe-based solar cells.

Original languageEnglish
Pages (from-to)2228-2234
Number of pages7
JournalSolar Energy Materials and Solar Cells
Volume90
Issue number15
DOIs
Publication statusPublished - 22 Sept 2006
Externally publishedYes

Keywords

  • Bi doping
  • CSVT method
  • CdTe
  • Physical properties
  • Thin films

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