Abstract
A study of the physical properties of CdTe thin films doped with Bi is presented. CdTe:Bi thin films were deposited by the close space vapor transport (CSVT) technique using powdered CdTe:Bi crystals grown by the vertical Bridgman method. CdTe:Bi crystals were obtained with nominal Bi doping concentrations varying in the 1×1017-8×1018 cm-3 range. The physical properties of CdTe:Bi thin films were studied performing photoluminescence, X-ray, SEM, photoacoustic spectroscopy and resistivity measurements. We observed a decrease of the resistivity values of CdTe:Bi films with the Bi content as low as 6×105 Ω-cm for Bi concentrations of 8×1018 cm-3. These are meaningful results for CdTe-based solar cells.
| Original language | English |
|---|---|
| Pages (from-to) | 2228-2234 |
| Number of pages | 7 |
| Journal | Solar Energy Materials and Solar Cells |
| Volume | 90 |
| Issue number | 15 |
| DOIs | |
| Publication status | Published - 22 Sept 2006 |
| Externally published | Yes |
Keywords
- Bi doping
- CSVT method
- CdTe
- Physical properties
- Thin films
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