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Leveraging Deep Learning for Fault Detection and Classification of Induction Machines: A Review

  • Texas A&M University
  • Technical University of Munich
  • University of Hertfordshire

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The management of incipient faults in induction machines (IMs) is crucial for ensuring reliability and efficiency in diverse industrial applications, including power grids, electric vehicles, and manufacturing processes. This review explores advanced fault detection and diagnosis (FDD) strategies, emphasizing deep learning (DL) methods such as convolutional neural networks (CNN), recurrent neural networks (RNN), and autoencoders for fault detection and classification. Traditional machine learning (ML) approaches are also discussed, highlighting their integration with signal processing techniques like wavelet transforms and Fourier transforms to enhance FDD accuracy. Additionally, the potential of physics-informed neural networks (PINNs) is examined, demonstrating how incorporating physical knowledge into data-driven models can improve diagnostic precision. The paper presents an analysis of recent publications, identifies current research gaps, and proposes future directions, including the development of robust AI-based FDD systems and the consideration of stochastic industrial data for more accurate predictive maintenance. By offering a comprehensive overview of FDD techniques and highlighting key research areas, this review aims to advance the reliability and performance of IMs.

Original languageEnglish
Title of host publicationIecon 2024-50th Annual Conference Of The Ieee Industrial Electronics Society
PublisherIEEE Computer Society
Number of pages8
ISBN (Electronic)9781665464543
ISBN (Print)978-1-6654-6455-0
DOIs
Publication statusPublished - 6 Nov 2024
Externally publishedYes
Event50th Annual Conference of the IEEE Industrial Electronics Society, IECON 2024 - Chicago, United States
Duration: 3 Nov 20246 Nov 2024

Publication series

NameIeee Industrial Electronics Society

Conference

Conference50th Annual Conference of the IEEE Industrial Electronics Society, IECON 2024
Country/TerritoryUnited States
CityChicago
Period3/11/246/11/24

Keywords

  • Deep learning
  • Fault management
  • Feature extraction
  • Incipient faults
  • Induction machine

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