TY - GEN
T1 - Investigation of different metal contacts for perovskite solar cells
AU - Hossain, Mohammad Istiaque
AU - Aissa, Brahim
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - Various metal layers grown by e-beam evaporator have been studied to be used as metal contacts for large-scale perovskite solar cell devices. The evaporated films consist of gold (Au), silver (Ag), nickel (Ni), titanium (Ti), tin (Sn), copper (Cu), and molybdenum (Mo) were grown on glass substrates at room temperature with an optimized thickness. Later, the measured optical properties such as transmission and absorptance of such films were used computationally to extract the optimum device performance using SCAPS-1D software. Among all the layers, Ti based perovskite solar cells outperform other metal contacts with a power conversion efficiency of (>27%). The films were characterized optically, topologically, structurally, and morphologically using ultraviolet-visible (UV-Vis) three-dimensional (3D) profilometry, and scanning electron microscopy. The computational analysis confirms that screening of suitable metal back contact is necessary to increase device performance and stability significantly.
AB - Various metal layers grown by e-beam evaporator have been studied to be used as metal contacts for large-scale perovskite solar cell devices. The evaporated films consist of gold (Au), silver (Ag), nickel (Ni), titanium (Ti), tin (Sn), copper (Cu), and molybdenum (Mo) were grown on glass substrates at room temperature with an optimized thickness. Later, the measured optical properties such as transmission and absorptance of such films were used computationally to extract the optimum device performance using SCAPS-1D software. Among all the layers, Ti based perovskite solar cells outperform other metal contacts with a power conversion efficiency of (>27%). The films were characterized optically, topologically, structurally, and morphologically using ultraviolet-visible (UV-Vis) three-dimensional (3D) profilometry, and scanning electron microscopy. The computational analysis confirms that screening of suitable metal back contact is necessary to increase device performance and stability significantly.
UR - https://www.scopus.com/pages/publications/105016107656
U2 - 10.1109/PVSC59419.2025.11132856
DO - 10.1109/PVSC59419.2025.11132856
M3 - Conference contribution
AN - SCOPUS:105016107656
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 76
EP - 78
BT - 2025 IEEE 53rd Photovoltaic Specialists Conference, PVSC 2025
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 53rd IEEE Photovoltaic Specialists Conference, PVSC 2025
Y2 - 8 June 2025 through 13 June 2025
ER -