Incorporation of vanadium in liquid phase epitaxy films of LiNbO3

D. Callejo; M. D. Serrano; V. Bermudez; E. Dieguez; F. Agullo-Rueda; S. Manotas

doi:10.1117/12.351420

Incorporation of vanadium in liquid phase epitaxy films of LiNbO₃

D. Callejo^*, M. D. Serrano, V. Bermudez, E. Dieguez, F. Agullo-Rueda, S. Manotas

^*Corresponding author for this work

Universidad Autónoma de Madrid

Research output: Contribution to journal › Conference article › peer-review

Abstract

Lithium Niobate (LN) films were obtained by the Liquid Phase Epitaxy (LPE) technique on pure LN singledomain substrates in the horizontal LPE geometry. The composition of the films was analyzed using microphotoluminescence technique. With this technique a vanadium profile in the films was obtained and the diffusion of this element into the substrate was investigated. High resolution X-ray diffractometry (HRXRD), X-Ray Rocking Curves enabled to study the crystallinity of the epitaxial films. Further investigations were carried out on the Li composition variation between film and substrate by the Microraman technique. The results were compared with that obtained by Rocking Curves.

Original language	English
Pages (from-to)	222-230
Number of pages	9
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3793
DOIs	https://doi.org/10.1117/12.351420
Publication status	Published - 1999
Externally published	Yes
Event	Proceedings of the 1999 Operational Characteristics and Crystal Growth of NonLinear Optical Materials - Denver, CO, USA Duration: 19 Jul 1999 → 20 Jul 1999

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@article{4b64df7fde514daab74dcae021031667,

title = "Incorporation of vanadium in liquid phase epitaxy films of LiNbO3",

abstract = "Lithium Niobate (LN) films were obtained by the Liquid Phase Epitaxy (LPE) technique on pure LN singledomain substrates in the horizontal LPE geometry. The composition of the films was analyzed using microphotoluminescence technique. With this technique a vanadium profile in the films was obtained and the diffusion of this element into the substrate was investigated. High resolution X-ray diffractometry (HRXRD), X-Ray Rocking Curves enabled to study the crystallinity of the epitaxial films. Further investigations were carried out on the Li composition variation between film and substrate by the Microraman technique. The results were compared with that obtained by Rocking Curves.",

author = "D. Callejo and Serrano, \{M. D.\} and V. Bermudez and E. Dieguez and F. Agullo-Rueda and S. Manotas",

year = "1999",

doi = "10.1117/12.351420",

language = "English",

volume = "3793",

pages = "222--230",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Proceedings of the 1999 Operational Characteristics and Crystal Growth of NonLinear Optical Materials ; Conference date: 19-07-1999 Through 20-07-1999",

}

TY - JOUR

T1 - Incorporation of vanadium in liquid phase epitaxy films of LiNbO3

AU - Callejo, D.

AU - Serrano, M. D.

AU - Bermudez, V.

AU - Dieguez, E.

AU - Agullo-Rueda, F.

AU - Manotas, S.

PY - 1999

Y1 - 1999

N2 - Lithium Niobate (LN) films were obtained by the Liquid Phase Epitaxy (LPE) technique on pure LN singledomain substrates in the horizontal LPE geometry. The composition of the films was analyzed using microphotoluminescence technique. With this technique a vanadium profile in the films was obtained and the diffusion of this element into the substrate was investigated. High resolution X-ray diffractometry (HRXRD), X-Ray Rocking Curves enabled to study the crystallinity of the epitaxial films. Further investigations were carried out on the Li composition variation between film and substrate by the Microraman technique. The results were compared with that obtained by Rocking Curves.

AB - Lithium Niobate (LN) films were obtained by the Liquid Phase Epitaxy (LPE) technique on pure LN singledomain substrates in the horizontal LPE geometry. The composition of the films was analyzed using microphotoluminescence technique. With this technique a vanadium profile in the films was obtained and the diffusion of this element into the substrate was investigated. High resolution X-ray diffractometry (HRXRD), X-Ray Rocking Curves enabled to study the crystallinity of the epitaxial films. Further investigations were carried out on the Li composition variation between film and substrate by the Microraman technique. The results were compared with that obtained by Rocking Curves.

UR - https://www.scopus.com/pages/publications/0033360684

U2 - 10.1117/12.351420

DO - 10.1117/12.351420

M3 - Conference article

AN - SCOPUS:0033360684

SN - 0277-786X

VL - 3793

SP - 222

EP - 230

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Proceedings of the 1999 Operational Characteristics and Crystal Growth of NonLinear Optical Materials

Y2 - 19 July 1999 through 20 July 1999

ER -

Incorporation of vanadium in liquid phase epitaxy films of LiNbO₃

Abstract

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