Experimental study on buckle evolution of thin inorganic layers on a polymer substrate

  • A. A. Abdallah*
  • , P. C.P. Bouten
  • , G. de With
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

21 Citations (Scopus)

Abstract

In this paper the behavior of a 250. nm and a 350. nm thick Indium tin oxide (ITO) layers deposited on a 200 μm thick high temperature aromatic polyester substrate (Arylite™) and spin coated with a 3 μm silica-acrylate hybrid coating (Hard Coat) is discussed. In-situ optical microscopy of the layered structures under uniaxial compressive strain was used to determine the buckle delamination rate at different applied strains. The effect of applied uniaxial compressive strain and layer thickness on the evolution of buckle width and height was investigated. The biaxial-residual stress, uniaxial compressive stress, poor adhesion at the interface and Poisson's ratio are believed to be responsible for the formation of telephone-cord buckling.

Original languageEnglish
Pages (from-to)2896-2905
Number of pages10
JournalEngineering Fracture Mechanics
Volume77
Issue number14
DOIs
Publication statusPublished - Sept 2010
Externally publishedYes

Keywords

  • Buckle evolution
  • Delamination rate
  • Interfacial toughness

Fingerprint

Dive into the research topics of 'Experimental study on buckle evolution of thin inorganic layers on a polymer substrate'. Together they form a unique fingerprint.

Cite this