TY - JOUR
T1 - Effects of annealing temperature on the phase formation, optical, photoluminescence and magnetic properties of sol-gel YFeO3 films
AU - Baqiah, Hussein
AU - Awang Kechik, Mohd Mustafa
AU - Al-Gaashani, Rashad
AU - Al-Zahrani, Asla A.
AU - Al-Hada, Naif Mohammed
AU - Zhang, Na
AU - Liu, Jian
AU - Xu, Shicai
N1 - Publisher Copyright:
© 2022 Elsevier Ltd and Techna Group S.r.l.
PY - 2023/1/1
Y1 - 2023/1/1
N2 - YFeO3 (YFO) thin films were deposited onto quartz substrates via sol-gel spin-coating technique and annealed at different temperature ranged between 650 and 900 degrees C. The impact of annealing temperature on the phase formation, microstructural, optical, photoluminescence (PL) and magnetic properties of the films were systematically investigated. X-ray diffraction analysis revealed an amorphous structure in film annealed at 650 degrees C and formation of hexagonal-YFO (h-YFO) phase in films annealed at 750-800 degrees C. The films annealed at 850-900.C exhibited an orthorhombic-YFO (o-YFO) structure. Atomic force microscopy images of h-YFO films showed homogeneous surface with uniform particles size and shape. The particle size increased and had irregular shape in o-YFO films. The average particle size was 44 and 117 nm, while the root square roughness was 1.38 and 2.55 nm for h- and o-YFO films annealed at 750 and 850 degrees C, respectively. The optical band gap (Eg) was 2.53 and 2.86 eV for h- and o-YFO films annealed at 750 and 850.C, respectively. The PL spectra of h-YFO films were redshifted compared with that of o-YFO films. The PL emission related to near band edge was observed at 459.0 and 441.9 nm for h- and o-YFO films annealed at 750 and 850 degrees C, respectively. The magnetization was enhanced with the increasing of annealing temperature and has the value of 4.8 and 12.5 emu/cm(3) at 5000 Oe for h- and oYFO films annealed at 750 and 850 degrees C, respectively.
AB - YFeO3 (YFO) thin films were deposited onto quartz substrates via sol-gel spin-coating technique and annealed at different temperature ranged between 650 and 900 degrees C. The impact of annealing temperature on the phase formation, microstructural, optical, photoluminescence (PL) and magnetic properties of the films were systematically investigated. X-ray diffraction analysis revealed an amorphous structure in film annealed at 650 degrees C and formation of hexagonal-YFO (h-YFO) phase in films annealed at 750-800 degrees C. The films annealed at 850-900.C exhibited an orthorhombic-YFO (o-YFO) structure. Atomic force microscopy images of h-YFO films showed homogeneous surface with uniform particles size and shape. The particle size increased and had irregular shape in o-YFO films. The average particle size was 44 and 117 nm, while the root square roughness was 1.38 and 2.55 nm for h- and o-YFO films annealed at 750 and 850 degrees C, respectively. The optical band gap (Eg) was 2.53 and 2.86 eV for h- and o-YFO films annealed at 750 and 850.C, respectively. The PL spectra of h-YFO films were redshifted compared with that of o-YFO films. The PL emission related to near band edge was observed at 459.0 and 441.9 nm for h- and o-YFO films annealed at 750 and 850 degrees C, respectively. The magnetization was enhanced with the increasing of annealing temperature and has the value of 4.8 and 12.5 emu/cm(3) at 5000 Oe for h- and oYFO films annealed at 750 and 850 degrees C, respectively.
KW - Annealing temperature
KW - Band gap
KW - Photoluminescence Magnetization
KW - Sol-gel process
KW - YFeO3 film
UR - https://www.scopus.com/pages/publications/85137868983
U2 - 10.1016/j.ceramint.2022.09.028
DO - 10.1016/j.ceramint.2022.09.028
M3 - Article
AN - SCOPUS:85137868983
SN - 0272-8842
VL - 49
SP - 600
EP - 606
JO - Ceramics International
JF - Ceramics International
IS - 1
ER -