TY - GEN
T1 - Confession session
T2 - 2020 IEEE International Symposium on Circuits and Systems, ISCAS 2020
AU - Delbruck, Tobi
AU - Elfadel, Ibrahim M.
AU - Muzaffar, Shahzad
AU - Haessig, Germain
AU - Wang, Bo
AU - Bermak, Amine
AU - Graca, Rui
AU - Camuñas-Mesa, Luis
AU - Senevirathna, Bathiya
AU - Abshire, Pamela
AU - Afshar, Saeed
AU - Linares-Barranco, Bernabe
AU - Liu, Shih Chii
AU - Wang, Runchun
AU - Dudek, Piotr
AU - Carey, Stephen
AU - de la Rosa, Jose
AU - Dandin, Marc
AU - Lu, Sheung
AU - Frick, Vincent
AU - Serrano-Gotarredona, Teresa
AU - Lopez, Paula
AU - Payvand, Melika
AU - Madhavan, Advait
AU - Fossum, Eric
AU - Tieck, J. Camilo Vasquez
AU - Williams, Ian
AU - Liu, Yan
AU - Constandinou, Timothy
AU - Serb, Alexander
AU - Carmona-Galan, Ricardo
AU - Nawrocki, Robert
AU - Leon-Salas, Walter D.
AU - Linares-Barranco, Bernabe
AU - Serrano-Gotarredona, Teresa
AU - Delbruck, Tobi
AU - Leon-Salas, Walter D.
N1 - Publisher Copyright:
© 2020 IEEE
PY - 2020
Y1 - 2020
N2 - “Fail often to succeed sooner” is a common mantra that we are told is the secret to success. When reporting research results, however, scholars rarely write about their failed attempts and only focus on the successful ones. Perhaps the source of this disconnect between what we preach and what we do can be found in the underlying assumption that published work is meant to move the field forward and failed attempts supposedly do not. The goal of the confessions presented in this paper is to show that even failed attempts are genuine and valuable contributions to our field provided that we learn from our mistakes and correct them. The 27 confessions span from planning oversights, digital and analog design errors, misunderstanding of devices, overlooked parasitics, LVS errors, and troubles in testing.
AB - “Fail often to succeed sooner” is a common mantra that we are told is the secret to success. When reporting research results, however, scholars rarely write about their failed attempts and only focus on the successful ones. Perhaps the source of this disconnect between what we preach and what we do can be found in the underlying assumption that published work is meant to move the field forward and failed attempts supposedly do not. The goal of the confessions presented in this paper is to show that even failed attempts are genuine and valuable contributions to our field provided that we learn from our mistakes and correct them. The 27 confessions span from planning oversights, digital and analog design errors, misunderstanding of devices, overlooked parasitics, LVS errors, and troubles in testing.
UR - https://www.scopus.com/pages/publications/85109279505
U2 - 10.1109/ISCAS45731.2020.9180983
DO - 10.1109/ISCAS45731.2020.9180983
M3 - Conference contribution
AN - SCOPUS:85109279505
T3 - Proceedings - IEEE International Symposium on Circuits and Systems
BT - 2020 IEEE International Symposium on Circuits and Systems, ISCAS 2020 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 10 October 2020 through 21 October 2020
ER -