Confession session: Learning from others mistakes

P. Abshire; A. Bermak; R. Berner; G. Cauwenberghs; S. Chen; J. B. Christen; T. Constandinou; E. Culurciello; M. Dandin; T. Datta; T. Delbruck; P. Dudek; A. Eftekhar; R. Etienne-Cummings; G. Indiveri; M. K. Law; B. Linares-Barranco; J. Tapson; W. Tang; Y. Zhai

doi:10.1109/ISCAS.2011.5937774

Confession session: Learning from others mistakes

P. Abshire^*
, A. Bermak
, R. Berner
, G. Cauwenberghs
, S. Chen
, J. B. Christen
, T. Constandinou
, E. Culurciello
, M. Dandin
, T. Datta
, T. Delbruck
, P. Dudek
, A. Eftekhar
, R. Etienne-Cummings
, G. Indiveri
, M. K. Law
, B. Linares-Barranco
, J. Tapson
, W. Tang
, Y. Zhai

^*Corresponding author for this work

University of Maryland, College Park
Hong Kong University of Science and Technology
University of Zurich
University of California at San Diego
Nanyang Technological University
Arizona State University
Imperial College London
Yale University
University of Manchester
Johns Hopkins University
Seville Microelectronics Institute
University of Cape Town

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Citations (Scopus)

Abstract

People rarely put in their papers the things that didn't work, the mistakes they made, and how they found out what went wrong. Such confessions can help others learn how to avoid similar mistakes. Twenty-six confessions were collected to form the bulk of this paper. Themes that arise are errors that result from not understanding the limitations of simulation tools in modeling physical reality, chip verification errors that result from lack of clear communication between designers, and projects that are considered in their own isolated environment of technical challenges rather than the broader context of their environment or application.

Original language	English
Title of host publication	2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1149-1162
Number of pages	14
ISBN (Print)	9781424494736
DOIs	https://doi.org/10.1109/ISCAS.2011.5937774
Publication status	Published - 2011
Externally published	Yes

Publication series

Name	Proceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)	0271-4310

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10.1109/ISCAS.2011.5937774

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Abshire, P., Bermak, A., Berner, R., Cauwenberghs, G., Chen, S., Christen, J. B., Constandinou, T., Culurciello, E., Dandin, M., Datta, T., Delbruck, T., Dudek, P., Eftekhar, A., Etienne-Cummings, R., Indiveri, G., Law, M. K., Linares-Barranco, B., Tapson, J., Tang, W., & Zhai, Y. (2011). Confession session: Learning from others mistakes. In 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011 (pp. 1149-1162). Article 5937774 (Proceedings - IEEE International Symposium on Circuits and Systems). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISCAS.2011.5937774

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title = "Confession session: Learning from others mistakes",

abstract = "People rarely put in their papers the things that didn't work, the mistakes they made, and how they found out what went wrong. Such confessions can help others learn how to avoid similar mistakes. Twenty-six confessions were collected to form the bulk of this paper. Themes that arise are errors that result from not understanding the limitations of simulation tools in modeling physical reality, chip verification errors that result from lack of clear communication between designers, and projects that are considered in their own isolated environment of technical challenges rather than the broader context of their environment or application.",

author = "P. Abshire and A. Bermak and R. Berner and G. Cauwenberghs and S. Chen and Christen, \{J. B.\} and T. Constandinou and E. Culurciello and M. Dandin and T. Datta and T. Delbruck and P. Dudek and A. Eftekhar and R. Etienne-Cummings and G. Indiveri and Law, \{M. K.\} and B. Linares-Barranco and J. Tapson and W. Tang and Y. Zhai",

year = "2011",

doi = "10.1109/ISCAS.2011.5937774",

language = "English",

isbn = "9781424494736",

series = "Proceedings - IEEE International Symposium on Circuits and Systems",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "1149--1162",

booktitle = "2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011",

address = "United States",

}

Abshire, P, Bermak, A, Berner, R, Cauwenberghs, G, Chen, S, Christen, JB, Constandinou, T, Culurciello, E, Dandin, M, Datta, T, Delbruck, T, Dudek, P, Eftekhar, A, Etienne-Cummings, R, Indiveri, G, Law, MK, Linares-Barranco, B, Tapson, J, Tang, W & Zhai, Y 2011, Confession session: Learning from others mistakes. in 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011., 5937774, Proceedings - IEEE International Symposium on Circuits and Systems, Institute of Electrical and Electronics Engineers Inc., pp. 1149-1162. https://doi.org/10.1109/ISCAS.2011.5937774

Confession session: Learning from others mistakes. / Abshire, P.; Bermak, A.; Berner, R. et al.
2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011. Institute of Electrical and Electronics Engineers Inc., 2011. p. 1149-1162 5937774 (Proceedings - IEEE International Symposium on Circuits and Systems).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Confession session

T2 - Learning from others mistakes

AU - Abshire, P.

AU - Bermak, A.

AU - Berner, R.

AU - Cauwenberghs, G.

AU - Chen, S.

AU - Christen, J. B.

AU - Constandinou, T.

AU - Culurciello, E.

AU - Dandin, M.

AU - Datta, T.

AU - Delbruck, T.

AU - Dudek, P.

AU - Eftekhar, A.

AU - Etienne-Cummings, R.

AU - Indiveri, G.

AU - Law, M. K.

AU - Linares-Barranco, B.

AU - Tapson, J.

AU - Tang, W.

AU - Zhai, Y.

PY - 2011

Y1 - 2011

N2 - People rarely put in their papers the things that didn't work, the mistakes they made, and how they found out what went wrong. Such confessions can help others learn how to avoid similar mistakes. Twenty-six confessions were collected to form the bulk of this paper. Themes that arise are errors that result from not understanding the limitations of simulation tools in modeling physical reality, chip verification errors that result from lack of clear communication between designers, and projects that are considered in their own isolated environment of technical challenges rather than the broader context of their environment or application.

AB - People rarely put in their papers the things that didn't work, the mistakes they made, and how they found out what went wrong. Such confessions can help others learn how to avoid similar mistakes. Twenty-six confessions were collected to form the bulk of this paper. Themes that arise are errors that result from not understanding the limitations of simulation tools in modeling physical reality, chip verification errors that result from lack of clear communication between designers, and projects that are considered in their own isolated environment of technical challenges rather than the broader context of their environment or application.

UR - https://www.scopus.com/pages/publications/79960882910

U2 - 10.1109/ISCAS.2011.5937774

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M3 - Conference contribution

AN - SCOPUS:79960882910

SN - 9781424494736

T3 - Proceedings - IEEE International Symposium on Circuits and Systems

SP - 1149

EP - 1162

BT - 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011

PB - Institute of Electrical and Electronics Engineers Inc.

ER -

Abshire P, Bermak A, Berner R, Cauwenberghs G, Chen S, Christen JB et al. Confession session: Learning from others mistakes. In 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011. Institute of Electrical and Electronics Engineers Inc. 2011. p. 1149-1162. 5937774. (Proceedings - IEEE International Symposium on Circuits and Systems). doi: 10.1109/ISCAS.2011.5937774

Confession session: Learning from others mistakes

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