Abstract
CdTe films were deposited by closed space sublimation from different CdTe:Bi targets (from non-doped up to 0.16at.%) previously sintered by the Bridgman method. X-ray diffraction measurements demonstrate that CdTe films are formed and Bi is incorporated. Electrical and optical characterizations show that thin films reproduce the bulk material behaviour with a decrease in resistivity and an increase in photoconductivity. Also a limit is found in the increase of photoconductivity properties versus Bi concentration.
| Original language | English |
|---|---|
| Article number | 011 |
| Pages (from-to) | 7163-7169 |
| Number of pages | 7 |
| Journal | Journal of Physics Condensed Matter |
| Volume | 18 |
| Issue number | 31 |
| DOIs | |
| Publication status | Published - 9 Aug 2006 |
| Externally published | Yes |