Application of capacitance-based techniques to the characterization of multijunction solar cells

Carmen M. Ruiz; Ignacio Rey-Stolle; Iván García; Enrique Barrigón; Pilar Espinet; Edgardo Saucedo; Verónica Bermúdez; Carlos Algora

doi:10.1109/PVSC.2009.5411384

Application of capacitance-based techniques to the characterization of multijunction solar cells

Carmen M. Ruiz, Ignacio Rey-Stolle, Iván García, Enrique Barrigón, Pilar Espinet, Edgardo Saucedo, Verónica Bermúdez, Carlos Algora

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Citations (Scopus)

Abstract

In this paper we intend to expand the portfolio of non-destructive techniques available for the individual characterization of the subcells in a monolithic multijunction stack. The goal is to explore the use of low-temperature, variable frequency, capacitance-based techniques to extract information of the minority carrier parameters, presence of traps and electronic defects in each subcell in the device. Despite this technique has been extensively applied for the characterization of thin-film materials and devices it has deserved little attention in the field of III-V multijunction solar cells.

Original language	English
Title of host publication	2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1600-1603
Number of pages	4
ISBN (Print)	9781424429509
DOIs	https://doi.org/10.1109/PVSC.2009.5411384
Publication status	Published - 2009
Externally published	Yes
Event	2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009 - Philadelphia, PA, United States Duration: 7 Jun 2009 → 12 Jun 2009

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Conference

Conference	2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009
Country/Territory	United States
City	Philadelphia, PA
Period	7/06/09 → 12/06/09

Access to Document

10.1109/PVSC.2009.5411384

Cite this

Ruiz, C. M., Rey-Stolle, I., García, I., Barrigón, E., Espinet, P., Saucedo, E., Bermúdez, V., & Algora, C. (2009). Application of capacitance-based techniques to the characterization of multijunction solar cells. In 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009 (pp. 1600-1603). Article 5411384 (Conference Record of the IEEE Photovoltaic Specialists Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2009.5411384

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title = "Application of capacitance-based techniques to the characterization of multijunction solar cells",

abstract = "In this paper we intend to expand the portfolio of non-destructive techniques available for the individual characterization of the subcells in a monolithic multijunction stack. The goal is to explore the use of low-temperature, variable frequency, capacitance-based techniques to extract information of the minority carrier parameters, presence of traps and electronic defects in each subcell in the device. Despite this technique has been extensively applied for the characterization of thin-film materials and devices it has deserved little attention in the field of III-V multijunction solar cells.",

author = "Ruiz, \{Carmen M.\} and Ignacio Rey-Stolle and Iv{\'a}n Garc{\'i}a and Enrique Barrig{\'o}n and Pilar Espinet and Edgardo Saucedo and Ver{\'o}nica Berm{\'u}dez and Carlos Algora",

year = "2009",

doi = "10.1109/PVSC.2009.5411384",

language = "English",

isbn = "9781424429509",

series = "Conference Record of the IEEE Photovoltaic Specialists Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "1600--1603",

booktitle = "2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009",

address = "United States",

note = "2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009 ; Conference date: 07-06-2009 Through 12-06-2009",

}

Ruiz, CM, Rey-Stolle, I, García, I, Barrigón, E, Espinet, P, Saucedo, E, Bermúdez, V & Algora, C 2009, Application of capacitance-based techniques to the characterization of multijunction solar cells. in 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009., 5411384, Conference Record of the IEEE Photovoltaic Specialists Conference, Institute of Electrical and Electronics Engineers Inc., pp. 1600-1603, 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009, Philadelphia, PA, United States, 7/06/09. https://doi.org/10.1109/PVSC.2009.5411384

Application of capacitance-based techniques to the characterization of multijunction solar cells. / Ruiz, Carmen M.; Rey-Stolle, Ignacio; García, Iván et al.
2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009. Institute of Electrical and Electronics Engineers Inc., 2009. p. 1600-1603 5411384 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Application of capacitance-based techniques to the characterization of multijunction solar cells

AU - Ruiz, Carmen M.

AU - Rey-Stolle, Ignacio

AU - García, Iván

AU - Barrigón, Enrique

AU - Espinet, Pilar

AU - Saucedo, Edgardo

AU - Bermúdez, Verónica

AU - Algora, Carlos

PY - 2009

Y1 - 2009

N2 - In this paper we intend to expand the portfolio of non-destructive techniques available for the individual characterization of the subcells in a monolithic multijunction stack. The goal is to explore the use of low-temperature, variable frequency, capacitance-based techniques to extract information of the minority carrier parameters, presence of traps and electronic defects in each subcell in the device. Despite this technique has been extensively applied for the characterization of thin-film materials and devices it has deserved little attention in the field of III-V multijunction solar cells.

AB - In this paper we intend to expand the portfolio of non-destructive techniques available for the individual characterization of the subcells in a monolithic multijunction stack. The goal is to explore the use of low-temperature, variable frequency, capacitance-based techniques to extract information of the minority carrier parameters, presence of traps and electronic defects in each subcell in the device. Despite this technique has been extensively applied for the characterization of thin-film materials and devices it has deserved little attention in the field of III-V multijunction solar cells.

UR - https://www.scopus.com/pages/publications/77951532048

U2 - 10.1109/PVSC.2009.5411384

DO - 10.1109/PVSC.2009.5411384

M3 - Conference contribution

AN - SCOPUS:77951532048

SN - 9781424429509

T3 - Conference Record of the IEEE Photovoltaic Specialists Conference

SP - 1600

EP - 1603

BT - 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009

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ER -

Ruiz CM, Rey-Stolle I, García I, Barrigón E, Espinet P, Saucedo E et al. Application of capacitance-based techniques to the characterization of multijunction solar cells. In 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009. Institute of Electrical and Electronics Engineers Inc. 2009. p. 1600-1603. 5411384. (Conference Record of the IEEE Photovoltaic Specialists Conference). doi: 10.1109/PVSC.2009.5411384

Application of capacitance-based techniques to the characterization of multijunction solar cells

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