TY - GEN
T1 - A sub-1V BJT-based CMOS temperature sensor from 55°C to 125°C
AU - Wang, Bo
AU - Law, Man Kay
AU - Tang, Fang
AU - Bermak, Amine
PY - 2012
Y1 - 2012
N2 - In this paper, a smart temperature sensor working at a supply voltage as low as 0.9V over the full military temperature range is presented. Low voltage operation is achieved by biasing the front-end BJT pairs with different emitter currents for two different sensing ranges, from 55°C to 30°C and from 20°C to 125°C, respectively. A second-order inverter-based ΣΔADC with dynamic element matching (DEM) and input signal chopping to control the conversion error to within 0:2°C is used for digital readout. Front-end bias currents are selected during the design stage to minimize the induced sensing error. The proposed sensor is implemented using the TSMC 0.18μm 1P6M process. Simulation result shows that a +1°C=0:1°C sensing error using one-point calibration can be achieved from 55°C to 125°C. At a sampling speed of 20 samples/s, the sensor consumes 3.4μA and 4.7μA in the low temperature range and the high temperature range, respectively.
AB - In this paper, a smart temperature sensor working at a supply voltage as low as 0.9V over the full military temperature range is presented. Low voltage operation is achieved by biasing the front-end BJT pairs with different emitter currents for two different sensing ranges, from 55°C to 30°C and from 20°C to 125°C, respectively. A second-order inverter-based ΣΔADC with dynamic element matching (DEM) and input signal chopping to control the conversion error to within 0:2°C is used for digital readout. Front-end bias currents are selected during the design stage to minimize the induced sensing error. The proposed sensor is implemented using the TSMC 0.18μm 1P6M process. Simulation result shows that a +1°C=0:1°C sensing error using one-point calibration can be achieved from 55°C to 125°C. At a sampling speed of 20 samples/s, the sensor consumes 3.4μA and 4.7μA in the low temperature range and the high temperature range, respectively.
UR - https://www.scopus.com/pages/publications/84866630746
U2 - 10.1109/ISCAS.2012.6271980
DO - 10.1109/ISCAS.2012.6271980
M3 - Conference contribution
AN - SCOPUS:84866630746
T3 - ISCAS 2012 - 2012 IEEE International Symposium on Circuits and Systems
SP - 3114
EP - 3117
BT - ISCAS 2012 - 2012 IEEE International Symposium on Circuits and Systems
PB - IEEE Computer Society
T2 - 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012
Y2 - 20 May 2012 through 23 May 2012
ER -