A Sub-1/°C Bandgap Voltage Reference with High-Order Temperature Compensation in 0.18-μm CMOS Process

  • Shalin Huang
  • , Mingdong Li
  • , Huan Li
  • , Peng Yin
  • , Zhou Shu*
  • , Amine Bermak
  • , Fang Tang*
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

50 Citations (Scopus)

Abstract

This paper presents a high-precision bandgap voltage reference (BGR) with high-order temperature compensation. The compensation signal is generated by using both strong-inversion MOSFETs and Bipolar Junction transistors (BJTs), which cancels the high-order nonlinear term T\ln (T) in the BJT base-emitter voltage (VBE), and thus a low temperature coefficient (TC) over a wide temperature range is achieved. The proposed BGR circuit is fabricated in a 0.18-μm} CMOS process with an active area of 0.256 mm2 and a max power consumption of 1.35 mW. A minimum TC of 0.706 ppm/°C from 25°C to 125 °C is achieved after an 8-bit resistance trimming. The line sensitivity is 0.0146%/V operating from 3.2 V to 3.7 V. The BGR achieves a power supply rejection (PSR) of-63.4 dB and a noise spectrum density of 0.92 μ VlHz at 10 Hz.

Original languageEnglish
Pages (from-to)1408-1416
Number of pages9
JournalIEEE Transactions on Circuits and Systems I: Regular Papers
Volume69
Issue number4
DOIs
Publication statusPublished - 1 Apr 2022

Keywords

  • Bandgap voltage reference
  • High-order temperature compensation
  • Temperature coefficient

Fingerprint

Dive into the research topics of 'A Sub-1/°C Bandgap Voltage Reference with High-Order Temperature Compensation in 0.18-μm CMOS Process'. Together they form a unique fingerprint.

Cite this