A Fingertip-Mimicking 12×16 200μm-Resolution e-skin Taxel Readout Chip with per-Taxel Spiking Readout and Embedded Receptive Field Processing

  • Mark Daniel Alea*
  • , Ali Safa
  • , Flavio Giacomozzi
  • , Andrea Adami
  • , Inci Rüya Temel
  • , Leandro Lorenzelli
  • , Georges Gielen
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Citations (Scopus)

Abstract

This work describes an electronic skin (e-skin) taxel readout chip in 0.18 μ m CMOS technology, achieving the highest reported spatial resolution of 200 μ m, comparable to human fingertips. A key innovation is the integration on chip of a12 × 16 taxel array with per-taxel signal conditioning frontend and spiking readout combined with embedded neuromorphic first-order processing through Complex Receptive Fields (CRFs). The chip has been designed to incorporate a polyvinylidene fluoride (PVDF)-based piezoelectric sensor layer. Experimental results show that Spiking Neural Network (SNN)-based classification of the chip's spatiotemporal spiking output for input tactile stimuli such as texture and flutter frequency achieves excellent accuracies up to 97.1% and 99.2% of classification accuracy, respectively. This is despite using only a small 256-neuron SNN classifier, a low equivalent spike encoding resolution of 3-4 bits, a sub-Nyquist 2.2kHz population spiking rate, and a state-of-the-art per-taxel (12.33nW) and system (75 μ W -5mW) power consumption.

Original languageEnglish
Title of host publication2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9784863488069
DOIs
Publication statusPublished - 2023
Externally publishedYes
Event2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023 - Kyoto, Japan
Duration: 11 Jun 202316 Jun 2023

Publication series

NameDigest of Technical Papers - Symposium on VLSI Technology
Volume2023-June
ISSN (Print)0743-1562

Conference

Conference2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023
Country/TerritoryJapan
CityKyoto
Period11/06/2316/06/23

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