A 64 fJ/step 9-bit SAR ADC array with forward error correction and mixed-signal CDS for CMOS image sensors

Denis Guangyin Chen*, Fang Tang, Man Kay Law, Xiaopeng Zhong, Amine Bermak

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

48 Citations (Scopus)

Abstract

A 9 b Successive-Approximation-Register (SAR) Anglog-to-Digital Converter (ADC) with pilot-Digital-to-Analog Converter (pDAC) technique for image sensor applications is described in this paper}. Its Forward Error Correction (FEC) improves its robustness against device mismatch. It performs mixed-signal Correlated-Double-Sampling (CDS) using only the ADC's built-in capacitor array without any additional amplifier or memory. The ADC measures 490μ{\rm m}\times 7.4μ{\rm m} and is demonstrated in a low-power CMOS image sensors with column parallel ADCs. Measurement results from the prototype image sensor in 0.18μ{\rm m} technology shows that the ADC's Differential Non-Linearity (DNL) is reduced from 3.5 LSB to 1.2 LSB by its mixed-signal FEC algorithm, making its Figure-of-Merit (FoM) 64 fJ/step. Furthermore, when combined with the ADC's mixed-signal Correlated-Double-Sampling, the column FPN is reduced from 3.2% to 0.5% without any additional circuit.

Original languageEnglish
Article number6858095
Pages (from-to)3085-3093
Number of pages9
JournalIEEE Transactions on Circuits and Systems I: Regular Papers
Volume61
Issue number11
DOIs
Publication statusPublished - 1 Nov 2014
Externally publishedYes

Keywords

  • CMOS image sensor (CIS)
  • column-parallel SAR ADC
  • correlated double sampling (CDS)
  • error correction
  • single-ended ADC

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