Abstract
A 9 b Successive-Approximation-Register (SAR) Anglog-to-Digital Converter (ADC) with pilot-Digital-to-Analog Converter (pDAC) technique for image sensor applications is described in this paper}. Its Forward Error Correction (FEC) improves its robustness against device mismatch. It performs mixed-signal Correlated-Double-Sampling (CDS) using only the ADC's built-in capacitor array without any additional amplifier or memory. The ADC measures 490μ{\rm m}\times 7.4μ{\rm m} and is demonstrated in a low-power CMOS image sensors with column parallel ADCs. Measurement results from the prototype image sensor in 0.18μ{\rm m} technology shows that the ADC's Differential Non-Linearity (DNL) is reduced from 3.5 LSB to 1.2 LSB by its mixed-signal FEC algorithm, making its Figure-of-Merit (FoM) 64 fJ/step. Furthermore, when combined with the ADC's mixed-signal Correlated-Double-Sampling, the column FPN is reduced from 3.2% to 0.5% without any additional circuit.
| Original language | English |
|---|---|
| Article number | 6858095 |
| Pages (from-to) | 3085-3093 |
| Number of pages | 9 |
| Journal | IEEE Transactions on Circuits and Systems I: Regular Papers |
| Volume | 61 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - 1 Nov 2014 |
| Externally published | Yes |
Keywords
- CMOS image sensor (CIS)
- column-parallel SAR ADC
- correlated double sampling (CDS)
- error correction
- single-ended ADC